The No1 Ethical retailer for Books, CD’s, DVD’s & Games
30 Day Refund Guarantee

Buy Used and New Laung - Terng Wang Books

Results for Laung - Terng Wang

Showing 1 to 1 of 1 results
VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon) VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon) by Laung-Terng Wang,Cheng-Wen Wu,Xiaoqing Wen

VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)

by Laung-Terng Wang,Cheng-Wen Wu,Xiaoqing Wen


ISBN 13: 9780123705976

Format: Hardcover (808 pages)
Publisher: Morgan Kaufmann
Published: 14 Aug 2006

Save for later

 
New : $67.06  
New : $67.06